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Summary

Description
English: The FEI Titan 50-300 PICO is a double spherical aberration corrected and chromatic aberration corrected (S)TEM alongside with a monochromator, two electron biprisms and a direct electron detector after a post column energy filter. It allows a spatial resolution below 50 pm in both TEM and STEM modes.
Date
Source https://www.fz-juelich.de/er-c/EN/Expertise/Instrumentation/_node.html
Author ER-C, Forschungszentrum Jülich

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Captions

FEI Titan 50-300 PICO aberration-corrected electron microscope

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depicts

2 January 2010

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current12:59, 22 March 2021Thumbnail for version as of 12:59, 22 March 2021500 × 734 (210 KB)ManndaUploaded a work by ER-C, Forschungszentrum Jülich from https://www.fz-juelich.de/er-c/EN/Expertise/Instrumentation/_node.html with UploadWizard

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